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Brian Stine Email
VP and General Manager, Software and Data Analytics . Nanometrics Incorporated
Milpitas, CA
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Nanometrics Incorporated designs, manufactures, markets and support the thin film metrology systems for the semiconductor, flat panel display and magnetic recording head industries. The Company's thin film thickness measurement systems use microscope-based, non-contact spectroscopic reflectometry. Some of the Company's systems provide complementary spectroscopic ellipsometry to measure the thickness and optical characteristics of films on a variety of substrates. In addition, the Company has both integrated and standalone optical critical metrology systems to measure critical dimensions of patterns on semiconductor wafers. The Company also manufactures a line of optical overlay registration systems that are used to determine the alignment accuracy of successive layers of semiconductor patterns on wafers in the photolithography process. The Company's products can be divided into three groups: automated systems, integrated systems and tabletop systems.Nanometrics Incorporated Address
1550 Buckeye DriveMilpitas, CA
United States